Literaturverzeichnis zu den Themen unserer Seiten

Auf dieser Seite haben wir für unsere Besucher wichtige Literatur zur Elektronenmikroskopie und zur Elektronenstrahl-Mikroanalyse zusammengestellt.

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nach untenRasterelektronenmikroskopie, allgemein
nach untenEDX-Analytik
nach untenWDX-Analytik
nach untenAnwendungen in der Werkstofftechnik
nach untenAnwendungen in den Geowissenschaften



Rasterelektronenmikroskopie, allgemein

FLEGLER, Stanley L.; HECKMAN, John W.; KLOMPARENS, Karen L. (1995): Elektronenmikroskopie. Grundlagen, Methoden, Anwendungen. - 279 S., H (Spektrum Akademischer Verlag).

GLAUERT, A.M. (1974): Practical methods in electron microscopy. Vol.II. - (Elsevier).

GOLDSTEIN, J.I.; NEWBURY, D.E.; ECHLIN, P.; JOY, D.C.; FIORI, C. & LIFSHIN, E. (1992): Scanning electron microscopy and x-ray microanalysis. - 2nd ed., 820 pp., New York (Plenum Press).
Umfassendes Standardwerk

GOODHEW, P.J. & HUMPHREYS, F.J. (1988): Electron microscopy and analysis. - XII + 232 pp., London (Taylor & Francis).

GRASENICK, F. et al. (1991): Elektronenmikroskopie. Erweiterte Einsatzmöglichkeiten durch neue Entwicklungen und spezielle Abbildungs- und Präparationsmethoden. - 303 pp., Ehningen b. Böblingen (expert Verlag).
Für fortgeschrittene Anwender geeignet

JOY, D.C. (1975): The observation of crystalline materials in the scanning electron microscope (SEM). - J. Microsc., 103, 1-23. KAY, D.H. (1965): Techniques for electron microscopy. - 2nd ed., XIV+560 pp., Oxford (Blackwell).

LANGE, R.H. & BLÖDORN, J. (1981): Das Rasterelektronenmikroskop. TEM + REM. Leitfaden für Biologen und Mediziner. - 327 pp., Stuttgart (Thieme).
Schwerpunkt bei Anwendungen aus der Biologie

LYMAN, C. E. (1990): Scanning electron microscopy, X-ray microanalysis and analytical electron microscopy. A laboratory workbook. - XI, 407 S., New York (Plenum Press).
Gute Darstellung aller Techniken

OHNSORGE, J. (1978): Rasterelektronenmikroskopie. - Stuttgart (Thieme).

MALIN, D.F. (1975): Photographic aspects of scanning electron microscopy. - J. Microsc., 103, 79-87.

POSTEK, M.T.; HOWARD, K.S.; JOHNSON, A.H. & McMICHAEL, K.L.: Scanning electron microscopy.

REIMER, L. & PFEFFERKORN, G. (1977). Rasterelektronenmikroskopie. - 2. ed., XI + 282 pp., Berlin (Springer).
Erstes umfassendes Standardwerk, vergriffen

REIMER, L. (1985): Scanning electron microscopy. Physics of image formation and microanalysis. - XVIII+457 pp., Berlin (Springer).

SCHMIDT, Peter F. (1994): Praxis der Rasterelektroenmikroskopie und Mikrobereichsanalyse. - 810 pp., Kontakt & Studium, 444, Renningen (expert Verlag).
Schwerpunkt bei Anwendungen aus der Werkstofftechnik

WATT, I.M. (1985): The principles and practice of electron microscopy.- VIII + 303 pp., Cambridge (Cambridge University Press).
Gute Zusammenfassung

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EDX-Analytik

DUNHAM, A.C. & WILKINSON, F.C.F. (1978): Accuracy, precision and detection limits of energy-dispersive electron-microprobe analysis of silicates. - X-ray spectrom., 7, 50-55.

RUSS, J.C. (1984): Fundamentals of energy-dispersive X-ray analysis.- London (Butterworths).

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WDX-Analytik

ALBEE, A.L. & RAY, L. (1970): Correction factors for electron probe microanalysis of silicates, oxides, carbonates, phosphates, and sulfates. - Anal. Chem., 42, 1408-1414.

BASTIN, G.F. & HEIJLIGERS, H.J.M. (1991): Quantitative electron probe microanalysis of nitrogen. - Scanning, 13, 325- 342.

CLIFF, G. & LORIMER, G.W. (1975): The quantitative analysis of thin specimens. - J. Microsc., 103, 203-207.

DROOP, G.T.R. (1987): A general equation for estimating Fe3+ concentrations in ferromagnesian silicates and oxides from microprobe analyses, using stochiometric criteria. - Mineralogical Magazine, 51, 431-435.

FIALIN, M. (1988): Modification of Philibert-Tixier ZAF correction for geological samples. - X-ray spectrom., 17, 103-106.

GOODHEW, P.J. & GULLEY, J.E.C. (1975): The determination of alkali metals in glasses by electron microprobe analysis. - Glass Technol., 15, 123-126.

HARRIS, D.E. (1990): Electron-microprobe analysis. - In: Advanced microscopic studies of ore minerals (J.L LAMBOR & D.J VAUGHAN eds.), Mineral. Assoc. Canada Short Course Handbook, 17, 319-339, Ottawa.

HEINRICH, K.F.J. & NEWBURY, D.E. (1991): Electron probe quantification. - New York (Plenum Press).

HREN, J.J.; GOLDSTEIN, J.I. & JOY, D.C. (1979): Introduction to analytical electron microscopy. - New York (Plenum Press).

JOY, D.C.; ROMIG, A.D. & GOLDSTEIN, J.I. (1986): Principles of analytical electron microscopy. - New York (Plenum Press).

KERRICK, D.M.; EMINHIZER, L.B. & VILLAUME, J.F. (1973): The role of carbon film thickness in electron microprobe analysis. - Amer. Mineral., 79, 745-749.

LAFLAMME, J.H.G. (1990): The preparation of materials for microscopic study. - In: Advanced microscopic studies of ore minerals (J.L LAMBOR & D.J VAUGHAN eds.), Mineral. Assoc. Canada Short Course Handbook, 17, 37-68, Ottawa.

LANE, S.J. & DALTON, J.A. (1994): Electron microprobe analysis of geological carbonates. - Amer. Mineral., 79, 745- 749.

LLOYD, G.E.; SCHMIDT, N.-H.; MAINPRICE, D. & PRIOR, D.J. (1991): Crystalline textures. - Mineral. Mag, 55, 331-345.

LOHNES, R.A. & DEMIREL, T. (1978): SEM applications in soil mechanics. - Scann. Electron Microsc., 1978/I, 643-654.

MARINENKO, R.B.; MYKLEBUST, R.L.; BRIGHT, D.S. & NEWBURY, D.E. (1987): Digital X-ray compositional mapping with "standard map" corrections for wavelength-dispersive spectrometer defocusing. - J. Microsc., 145, 207-223.

MORGAN, A.J.: X-ray microanalysis in electron microscopy for biologists. - The royal Microcopical Society laboratory series of handbooks on microscopy.

PETRUK, W. (1988): The capabilities of the microprobe Kontron image analysis system: application to mineral benefication. - Scann. Microsc.,2, 1247-1256.

PLESCH, R. (1978): Praktische Fehlertheorie der Röntgenspektrometrie. - X-ray spectrom., 7, 156-159.

POTTS, P.J.; BOWLES, J.F.W.; REED, S.J.B. & CAVE, M.R. (1995): Microprobe techniques in the earth sciences. - The Miner. Soc. Series, 6, XII + 419 pp., London (Chapman Hall).

POTTS, P.J.; TINDLE, A.G. & ISAACS, M.C. (1983): On the precision of electron microprobe data: a new test for the homogeneity of mineral standards. - Amer. Mineral., 68, 1237-1242.

POTTS, P.J.; TINDLE, A.G. & STANFORD, D. (1995): A new procedure for relocating mineral grains for microprobe analysis. - Mineralogical Magazine, 59, 221-228.

POTTS, P.J. & TINDLE, A.G. (1991): Evaluation of spectrum overlap correction in energy-dispersive X-ray spectrometry using the digital filter deconvolution procedure: application to selected interferences encountered in the microprobe analysis of minerals. - X-ray Spectrom., 20, 119-129.

PURVIS, K. (1991): Fibrous clay mineral collapse produced by beam during scanning electron microscopy. - Clay Minerals, 26, 141-145.

REED, S.J.B. & WARE, N.G: (1975): Quantitative electron microprobe analysis of silicates using energy-dispersive X-ray spectrometry. - J.Petrol., 16, 499-519.

REED, S.J.B. (1990): Fluorescence effects in quantitative microprobe analysis. - In: Microbeam analysis (D.B. WILLIAMS; P. INGRAM & J. MICHAEL eds.), 109-114, San Francisco (San Francisco Press).

REED, S.J.B. (1993): Electron microprobe analysis. - 2. ed., XVIII, 326 S., Cambridge (Cambridge University Press).

REED, S.J.B. (1996): Electron microprobe analysis and scanning electron microscopy in geology. - XII, 201 S., Cambridge (Cambridge Univ. Press).
Gutes Standardwerk

RICHARD, L.R. & CLARKE, D.B. (1990): AMPHIBOL: A program for calculating structural formulae and for classifying and plotting chemical analyses of amphiboles. - Amer. Mineral., 75, 421-423.

ROBINSON, W.E.; CUTMORE, N.G. & BURDON, R.G. (1984): Quantitative compositional analysis using a backscattered electron signal in a scanning electron microscope. - Scann. Electron Microsc., 1984/II, 483-492.

RUCKLIDGE, J.C.; GIBB, F.G.F.; FAWCETT, J.J. & GASPARINNI, E.L.(1970): Rapid rock analysis by electron microprobe. - Geochim. Cosmochim. Acta, 34, 243-247.

SAIMOTO, S.; HELMSTAEDT, H.; KEMPSON. D. & SCHULSON, E.M. (1980): Electron chanelling and its potential for petrographic studies. - Canad. Mineral., 18, 251- 259.

SCOTT, V.D.; LOVE, G. & REED, S.J.B. (1995): Quantitative electron probe microanalysis. - 2. ed., XIV, 311 S., New York (Ellis Horwood).

SMELLIE, J.A.T. (1972): Preparation of glass standards for the use in X-ray microanalysis. - Mineralogical Magazine, 38, 614-617.

WARE, N.G. (1991): Combined energy-dispersive-wavelength- dispersive quantitative electron microprobe nalysis. - X-ray Spectrom., 20, 73-79.

WICKS, F.J. & PLANT, A.G. (1983): The accuracy and precision of routine energy-dispersive electron microprobe analysis of serpentine. - X-ray Spectrom., 12, 59-66.

WILLIAMS, D.B.; INGRAM, P. & MICHAEL, J. eds. (1990): Microbeam analysis. - San Francisco (San Francisco Press).

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Anwendungen in der Werkstofftechnik

DVM (Hrsg.) (1982): Materialkundliche Gefüge-, Bruch- und Oberflächenuntersuchungen in Produktion und Schadensforschung. 355 S. Berlin (Deutscher Verband für Materialprüfung e.V.).

ENGEL, L.; KLINGELE, H.;EHRENSTEIN, G.; SCHAPER, H. (1978): Rasterelektronenmikroskopische Untersuchungen von Kunststoffschäden. - 264 S., München, Wien (Hanser Verlag).

ENGEL, L.; KLINGELE, H. (): Rasterelektronenmikroskopische Untersuchungen von Metallschäden. München, Wien (Hanser Verlag).

GORFU, Paulos (1992): Untersuchung von Dünnschichtsystemen mittels Elektronenstrahl-Mikroanalyse. - 95 S., Diss. Techn. Univ. Dresden.

LATZKE, Peter M. (1988): Textile Fasern: Rasterelektronenmikroskopie der Chemie- und Naturfasern ; Analysieren, Klassifizieren, Ordnen / Latzke;Hesse. - Frankfurt/Main: Deutscher Fachverlag.

THOMPSON-RUSSELL, K.C. & EDINGTON, J.W. (1977): Electron microscope specimen preparation techniques in material science. - Monographs in Practical Electron microscopy in Material Science.

UHLIG, Wolfgang (1986): Schadensanalyse Systematik - Methoden - Werkstofftechnische Bewertungen. 135 S., Berlin (VEB Verlag Technik).

VDE,DVM,DGM (Hrsg.) (1983): Riß- und Brucherscheinungen bei metallischen Werkstoffen / The Appeareance of Cracks and Fractures in Metallic Materials. 68 S., Düsseldorf (Verlag Stahleisen).

YACOBI, B.G. ed. (1994): Microanalysis of solids. - XIII, 460 S., New York (Plenum Press).

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Anwendungen in den Geowissenschaften

ABRAHAM, K.; SCHREYER, W. (1973): Elementverteilung in koexistierenden Festkörperphasen. - 101 S., Opladen (Westdeutscher Verlag)

BEUTELSPACHER, H. & van der MAREL, H.W. (1968): Atlas of electron microscopy of clay minerals and their admixtures - A picture atlas . - 333 pp., Amsterdam (Elsevier).

BLASCHKE, R. (1970): Spezifische Oberflächen und Grenzflächen der Mineralphasen als Gefügeparameter. - Fortschr.Miner., 47, 197-241, Stuttgart.

GOLUBIC, S.; BRENT, G. & LECAMPION, T. (1975): Scanning electron microscopy of endolithic algae and fungi using a multipurpose casting-embedding technique. - Lethaia, 3, 203-209, Oslo.

JORDAN, P.G.; DÜGGELIN, M.; MATHYS, D. & GUGGENHEIM, R. (1991): Gypsum-anhydrite differentiation by SEM using the back-scattered electron signal. - J. Sediment. Petrol., 61, 616-618.

LINDÉ, Krister (1984): Scanning electron microscope studies of different sands and silts. - Acta Universitatis Upsaliensis (Abstr. of Uppsala diss. from the Faculty of Science), 748, 1-10, Uppsala.

McHARDY, W.J. & BIRNIE, A.C. (1987): Scanning electron microscopy.- In: A handbook of determinative methods in clay mineralogy (M.J.WILSON ed.), 173-208, Glasgow (Blackie).

NADEAU, P.H. & HURST, A. (1991): Application of back-scattered electron microscopy to the quantification of clay mineral microporosity in sandstones. - J. Sediment. Petrol., 61, 616-618.

SMART, & TOVEY, N.K. (1981): Electron microscopy of soils and sediments - examples. - 178 pp., Oxford (Clarendon Press).

SMART, P. & TOVEY, N.K. (1982): Electron microscopy of soils and sediments: Techniques. - Oxford (Oxford Univ. Press).

TREWIN, N.H. (1988): Use of the scanning electron microscope in sedimentology. - In: Techiques in sedimentology (M. TUCKER ed.), 229-273, Oxford (Blackwell).
Schneller, gründlicher Überblick

WILSON, M.D. & E.D. PITTMAN (1977): Authigenic clays in sandstone. - recognition and influence on reservoir properties and paleoenvironmental analysis. - J. Sediment. Petrol., 47, 1, 3-31.


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